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Classification
·Possibility to record the actual spatial position of the probe in the scanner for proper results processing when operating the scanning instruments;
·Possibility to measure the delay in prism of the probe;
·Possibility to measure the ultrasonic testing speed in the tested object;
·Imaging of changed coordinates of detected defects on B-scans and orthogonal types of B-scan.
·“freeze” mode of A-scan imaging;
·Mode of maximal signal accumulation in A-Scan;
·Possibility to install a memory device of compact-flash type with capacity 4 Gb.
·Connection mode with PC to input the information from the flaw detector memory, for testing results processing with a possibility to print them,program setting input from the PC to the flaw detector memory.
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