FEATURES

·Possibility to record the actual spatial position of the probe in the scanner for proper results processing when operating the scanning instruments;

·Possibility to measure the delay in prism of the probe;

·Possibility to measure the ultrasonic testing speed in the tested object;

·Imaging of changed coordinates of detected defects on B-scans and orthogonal types of B-scan.

·“freeze” mode of A-scan imaging;

·Mode of maximal signal accumulation in A-Scan;

·Possibility to install a memory device of compact-flash type with capacity 4 Gb.

·Connection mode with PC to input the information from the flaw detector memory, for testing results processing with a possibility to print them,program setting input from the PC to the flaw detector memory.